ATOMIC FORCE MICROSCOPY (AFM)

Model no: di INNOVA

ATOMIC FORCE MICROSCOPY (AFM)

Location: AFM lab, S.N. Bose National Centre For Basic Sciences

 

SPECIFICATIONS AND PERFORMANCE

1. System Configurations

Operates in Contact Mode, Tapping Mode, Phase Imaging, Lift Mode, Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM), Lateral Force Microscopy, Force Spectroscopy.

Optional : Scanning Tunneling Microscopy (STM), Conductive Atomic Force Microscopy (CAFM), Nanolithography.

2. Measurement Performance

Standard
Scanner Large Area(~90μm) piezoelectric scanner.
Scan Range

Maximum lateral scan range ~ 90 μm

Maximum vertical scan range  7.5 μm

Control Resolution

Maximum DAC lateral resolution - 0.25A°

Maximum DAC vertical resolution - 0.025A°

Optional
Scanner 5μm piezoelectric scanner
Scan Range

Maximum lateral scan range - 5 μm

Maximum vertical scan range - 2.5 μm.

Control Resolution

Maximum DAC lateral resolution - 0.0013A°

Maximum DAC vertical resolution - 0.009A°

3. Operating Environment

Temperature : 0°C to 30°C, 32°F to 112°F.
Humidity : 90% ; non condensing.

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