This is a PANalytical X-PERT PRO XRD unit installed in 2005 and it has the capability of performing
a.
Powder diffraction
b.
Thin film and multi-layer reflectivity
c.
high resolution rocking
curve analysis
d.
stress/texture analysis
e.
Small angle x-ray scattering (SAXS)
SPECIFICATIONS AND PERFORMANCE
| MODEL NO | PANalytical X-PERT PRO |
| SOURCE OF X-RAYS | Cu K-alpha, 1.54 Angstrom. (wave length), Mo K-alpha, 0.71 Angstrom (Wavelength) |
| DETECTOR | SCINTILLATION DETECTOR, PIXCEL DECTECTOR |
| SAMPLE STAGE | FIXED, WITH X-RAY SOURCE & DETECTOR ROTATION. |
| SAMPLE HOLDERS | SAMPLE HOLDERS ARE MADE OF ALUMINIUM, FOR POWDER SAMPLES WITH A VOLUME OF 15 mm×20 mm×1.8mm. |
| ZERO BACKGROUND CAPILLARIES & FIBRES |
ZERO BACKGROUND SAMPLE HOLDER IS AN OBLIQUELY CUTTED SILICON CRYSTAL WHICH CAN BE USED TO MOUNT VERY SMALL AMOUNT OF POWDER (< 1 mg), GLASS . . |
| MEASUREMENT RANGE | 5 DEG TO 140 DEG. |
| WORKING CONDITION | 45 KV & 40 mA |
Upgradation:
The system has been upgraded with high temperature attachment (1500 ºC) attachment.