Model no: di INNOVA
Location: AFM lab, S.N. Bose National Centre For Basic Sciences
SPECIFICATIONS AND PERFORMANCE
1. System Configurations
Operates in Contact Mode, Tapping Mode, Phase Imaging, Lift Mode, Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM), Lateral Force Microscopy, Force Spectroscopy.
Optional : Scanning Tunneling Microscopy (STM), Conductive Atomic Force Microscopy (CAFM), Nanolithography.
2. Measurement Performance
| Standard | |
| Scanner | Large Area(~90μm) piezoelectric scanner. |
| Scan Range | Maximum lateral scan range ~ 90 μm Maximum vertical scan range 7.5 μm |
| Control Resolution | Maximum DAC lateral resolution - 0.25A° Maximum DAC vertical resolution - 0.025A° |
| Optional | |
| Scanner | 5μm piezoelectric scanner |
| Scan Range | Maximum lateral scan range - 5 μm Maximum vertical scan range - 2.5 μm. |
| Control Resolution | Maximum DAC lateral resolution - 0.0013A° Maximum DAC vertical resolution - 0.009A° |
3. Operating Environment
Temperature : 0°C to 30°C, 32°F to 112°F.
Humidity : 90% ; non condensing.