Technical Specification
|
SOURCE OF ELECTRON |
FEG Source |
OPERATIONAL ACCELERATING VOLTAGE |
200 V-30 KV |
RESOLUTION |
@30KV@HIGH VACUUM CONDITIONS | 1.2 nm |
@30KV@LOW VACUUM CONDITIONS | 3.0 nm |
|
DETECTORS
|
- EVERHART-THORNLEY DETECTOR FOR SECONDARY ELECTRONS IN HIGH VACUUM.
- GSED FOR PRESSURES UP TO 2600kPa IN ESEM MODE OPERATION.
- LARGE FIELD SECONDARY ELECTRON DETECTOR FOR LOW VACUUM OPERATION.
- BACK SCATTERED ELECTRON DETECTOR IN HIGH VACUUM MODE IMAGING.
|
Fields of Research
|
- FESEM IMAGING WITH HIGH RESOLUTION AND HIGH CONTRAST.
- CHEMICAL ANALYSIS (EDAX).
- INVESTIGATIONS OF NON –CONDUCTIVE SPECIMENS UNDER LOW–VACUUM CONDITIONS.
- INVESTIGATIONS OF WET SAMPLES AT PRESSURES UP TO 2600 Pa UNDER ESEM MODE.
|