Environmental Scanning Electron Microscope (ESEM)

ESEM Unit at S N Bose National Centre For Basic Sciences

Technical Specification

SOURCE OF ELECTRON	W-FILAMENT
OPERATIONAL VOLTAGE	200 V-30 KV
RESOLUTION
@30KV@HIGH VACUUM CONDITIONS	2.4 nm
@30KV@LOW VACUUM CONDITIONS	3.0 nm
@30KV@E-SEM CONDITIONS	5.4 nm
BEAM CURRENT	100 μA

DETECTORS

EVERHART-THORNLEY DETECTOR FOR SECONDARY ELECTRONS IN HIGH VACUUM.

GSED FOR PRESSURES UP TO 40mbar IN ESEM MODE OPERATION.

LARGE FIELD SECONDARY ELECTRON DETECTOR FOR LOW VACUUM OPERATION.

Fields of Research:

1. SEM IMAGING WITH HIGH RESOLUTION AND HIGH CONTRAST.

2. CHEMICAL ANALYSIS (EDAX).

3. INVESTIGATIONS OF NON –CONDUCTIVE SPECIMENS UNDER LOW–VACUUM CONDITIONS.

4. INVESTIGATIONS OF WET SAMPLES AT PRESSURES UP TO 2600 Pa UNDER ESEM MODE.

5. PELTIER EFFECT ON E-SEM (We can cool between 0 to 10 deg C, specimen of very diverse in nature can be imaged)

Book A Slot